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Published in 2017 at "Journal of Electronic Materials"
DOI: 10.1007/s11664-017-5350-y
Abstract: We have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device…
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Keywords:
electrons away;
probe;
analysis scanned;
magnetic focusing ... See more keywords