LAUSR

Pitfalls for transient response analysis with VF-TLP

Sign Up to like & get
recommendations!
1 Published in 2021 at "Microelectronics Reliability"

DOI: 10.1016/j.microrel.2021.114309

Abstract: Abstract Analyzing transient ESD device behavior with TLP equipment requires more attention for implementation and measurement details than the classical quasi-static TLP approach. Minimizing hardware parasitics reduces the de-embedding effort and optimizes the quality of… read more here.

Keywords: analysis tlp; tlp; transient response; pitfalls transient ... See more keywords