High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model.
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DOI: 10.1364/oe.474794
Abstract: Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved… read more here.
Keywords: analysis umpa; wavefront marking; modulated pattern; pattern analysis ... See more keywords