Soft Matter X-ray Microanalysis in the Analytical Electron Microscope
Sign Up to like & getrecommendations! Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618004373
Abstract: The recent developments in large solid angle x-ray detectors [1] has not only increased the ability of microanalysts today to perform high spatial resolution spectroscopy in the Analytical Electron Microscope (AEM) during materials science investigations,… read more here.
Keywords: soft matter; ray; electron microscope; analytical electron ... See more keywords
Statistical Machine Learning and Compressed Sensing Approaches for Analytical Electron Tomography - Application to Phase Change Materials
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s143192761900151x
Abstract: Analytical electron tomography aims at achieving 3D chemical characterization at the nanoscale using energy dispersive x-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), or both simultaneously, in a scanning transmission electron microscope (STEM). Using conventional… read more here.
Keywords: spectroscopy; electron tomography; electron; machine learning ... See more keywords
Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619005208
Abstract: Many materials have regions of interest (ROIs) that are beneath the surface. A focused ion beam (FIB) is used to remove material at the microscale in order to expose these subsurface ROIs for analysis [1].… read more here.
Keywords: microscopy; high resolution; spectroscopy; resolution analytical ... See more keywords
Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron Microscope
Sign Up to like & getrecommendations! Published in 2022 at "Microscopy and Microanalysis"
DOI: 10.1017/s143192762101360x
Abstract: Abstract A wide range of X-ray detectors and geometries are available today on transmission/scanning transmission analytical electron microscopes. While there have been numerous reports of their individual performance, no single experimentally reproducible metric has been… read more here.
Keywords: ray detector; performance; solid angle; ray ... See more keywords
Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements
Sign Up to like & getrecommendations! Published in 2017 at "Measurement Science and Technology"
DOI: 10.1088/1361-6501/28/1/015904
Abstract: An analytical electron microscope based on the scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy (STEM-WDX) to realize highly sensitive elemental imaging especially for light elements has been developed. In this study, a large-solid-angle… read more here.
Keywords: based scanning; analytical electron; electron microscope; spectroscopy ... See more keywords