Silicon Nitride Metalenses for Close-to-One Numerical Aperture and Wide-Angle Visible Imaging
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DOI: 10.1103/physrevapplied.10.014005
Abstract: SiN is an emerging semiconductor for integrated optoelectronics, due to its ultralow loss in the visible region. Developing a high-performance SiN metamaterial lens (metalens) is attractive for on-chip optical devices, but is held back by… read more here.
Keywords: silicon nitride; angle visible; wide angle; visible imaging ... See more keywords