Evaluating the impact of thermal annealing on c-Si/Al2O3 interface: Correlating electronic properties to infrared absorption
Sign Up to like & getrecommendations! Published in 2018 at "AIP Advances"
DOI: 10.1063/1.5036738
Abstract: Al2O3 is the standard for the passivation of p-type PERC (Passivated Emitter Rear Contact) solar cells. It is well established that the thin interfacial silicon oxide layer in between Al2O3 and c-Si plays a key… read more here.
Keywords: annealing al2o3; al2o3 interface; thermal annealing; spectroscopy ... See more keywords