A Janovec‐Kay‐Dunn‐Like Behavior at Thickness Scaling in Ultra‐Thin Antiferroelectric ZrO2 Films
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DOI: 10.1002/aelm.202100485
Abstract: Originally based on phenomenological observations, the Janovec–Kay–Dunn (JKD) scaling law has been historically used to describe the dependence of the ferroelectric coercive fields (Ec) on a critical length scale of the material, wherein the film… read more here.
Keywords: antiferroelectric zro2; zro2; thickness; ultra thin ... See more keywords