Integrated Microscopy: Highly Accurate Light-Electron Image Correlation Anywhere on a Sample
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DOI: 10.1017/s1431927617007024
Abstract: Superresolution fluorescence has pushed the resolution of light microscopy (LM) towards length scales traditionally accessible only with electron microscopy (EM)[1]. Also, developments in scanning EM (SEM) have moved image dimensions for EM to typical LM… read more here.
Keywords: image; anywhere sample; microscopy; light electron ... See more keywords