Electric current paths in a Si:P delta-doped device imaged by nitrogen-vacancy diamond magnetic microscopy
Sign Up to like & getrecommendations! Published in 2022 at "Nanotechnology"
DOI: 10.1088/1361-6528/ac95a0
Abstract: The recently-developed ability to control phosphorous-doping of silicon at an atomic level using scanning tunneling microscopy, a technique known as atomic precision advanced manufacturing (APAM), has allowed us to tailor electronic devices with atomic precision,… read more here.
Keywords: microscopy; delta doped; nitrogen vacancy; apam ... See more keywords
Influence of composite flocculant FeCl3–APAM on vacuum drainage of river-dredged sludge
Sign Up to like & getrecommendations! Published in 2019 at "Canadian Geotechnical Journal"
DOI: 10.1139/cgj-2018-0268
Abstract: Sludge is an inevitable product of river dredging and is characterized by a high water content, high fluidity, and high heavy metal content. Its treatment requires consideration of the economic and environmental implications. In this… read more here.
Keywords: dredged sludge; composite flocculant; fecl3; drainage ... See more keywords