A High Accuracy Ion Conductance Imaging Method Based on the Approach Curve Spectrum.
Sign Up to like & getrecommendations! Published in 2020 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2020.113025
Abstract: Scanning ion conductance microscopy (SICM), as an emerging non-contact in situ topography measurement tool with nano resolution, has been increasingly used in recent years in biomedicine, electrochemistry and materials science. In the conventional measurement method… read more here.
Keywords: topography; ion; imaging method; approach curve ... See more keywords
Nanoscale Intelligent Imaging Based on Real-Time Analysis of Approach Curve by Scanning Electrochemical Microscopy.
Sign Up to like & getrecommendations! Published in 2019 at "Analytical chemistry"
DOI: 10.1021/acs.analchem.9b02361
Abstract: Scanning electrochemical microscopy (SECM) enables high-resolution imaging by examining the amperometric response of an ultramicroelectrode tip near a substrate. Spatial resolution, however, is compromised for non-flat substrates, where distances from a tip far exceed the… read more here.
Keywords: approach curve; tip; real time; microscopy ... See more keywords