BEHAVIOR OF THE Ti-Zr-Ni THIN FILM CONTAINING QUASICRYSTALLINE AND APPROXIMANT PHASES UNDER RADIATIVE-THERMAL ACTION IN TRANSITION MODES
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DOI: 10.46813/2020-126-003
Abstract: X-ray diffraction and SEM microscopy were used to study the structural and phase changes in a thin film obtained by magnetron sputtering of a Ti52Zr30Ni18 target (at.%) on a steel substrate under the radiation-thermal influence… read more here.
Keywords: action; quasicrystalline; thin film; approximant phases ... See more keywords