Consistency of the Two Component Composite Modeling Framework for NBTI in Large and Small Area p-MOSFETs
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DOI: 10.1109/ted.2016.2630311
Abstract: Consistency of the recently proposed deterministic composite modeling framework for Negative Bias Temperature Instability (NBTI) in large area devices is verified for stochastic NBTI in small area devices. The framework has two independent and uncoupled… read more here.
Keywords: small area; sub sub; framework; area ... See more keywords