On the Apparent Non-Arrhenius Temperature Dependence of Charge Trapping in IIIV/High- ${k}$ MOS Stack
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2018.2851189
Abstract: Operating temperature has a significant imp-act on the reliability of metal–oxide–semiconductor field effect transistors (MOSFETs). In Si-channel MOSFETs, the effective density of charged oxide defects ( $\Delta {N}_{\text {eff}}$ ) at operating condition typically shows… read more here.
Keywords: temperature; arrhenius temperature; temperature dependence; tex math ... See more keywords
Modeling of Both Arrhenius and Non-Arrhenius Temperature-Dependent Drain Current for Organic Thin-Film Transistors
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.3025269
Abstract: To describe both Arrhenius and non-Arrhenius temperature-dependent drain currents for the organic thin-film transistors, the effective trapped carrier concentration expression is presented. Based on the expression, following the Shur and Hack’s trap limited carrier conduction… read more here.
Keywords: dependent drain; arrhenius non; non arrhenius; arrhenius temperature ... See more keywords