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Optical Parameters of Both As2S3 and As2Se3 Thin Films from Ultraviolet to the Near-Infrared via Variable-Angle Spectroscopic Ellipsometer

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Published in 2020 at "Semiconductors"

DOI: 10.1134/s1063782620110020

Abstract: In the UV-visible-near infrared regions from 245 to 1000 nm, variable-angle spectroscopic ellipsometer (VASE) was used to investigate optical functions of As2S3 and As2Se3 thin films. In the entire measured spectral range, data were analyzed… read more here.

Keywords: thin films; near infrared; as2s3 as2se3; as2se3 thin ... See more keywords