Two-step carrier-wave stitching method for aspheric and freeform surface measurement with a standard spherical interferometer.
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DOI: 10.1364/ao.57.004743
Abstract: Measurement of aspheric and freeform surfaces remains challenging due to the various shapes of the surface under test (SUT), especially when the SUT has a large aperture and strong deviation from the spherical surface. This… read more here.
Keywords: aspheric freeform; freeform; carrier wave; two step ... See more keywords