Quantitative assessment and suppression of defect-induced scattering in low-loss mirrors.
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DOI: 10.1364/ol.43.006025
Abstract: In this Letter, defect-induced scattering in 1064 nm high-reflection coatings prepared by dual ion beam sputtering and its suppression were investigated by artificial nodules, finite-difference time-domain simulations, angular resolved scattering (ARS) measurements, and planarization technology. After… read more here.
Keywords: defect induced; quantitative assessment; assessment suppression; induced scattering ... See more keywords