Reliable and high performance asymmetric FinFET SRAM cell using back-gate control
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DOI: 10.1016/j.microrel.2019.113545
Abstract: Abstract As the technology scales down, the performance characteristics are degraded and the reliability of digital circuits against soft error and aging effects are reduced. In this paper, we propose a reliable asymmetric FinFET 6T… read more here.
Keywords: asymmetric finfet; sram cell; back gate; finfet sram ... See more keywords