Artificial Neural Network Model for Evaluating Parameters of Reflection-Asymmetric Samples From Reference-Plane-Invariant Measurements
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DOI: 10.1109/tim.2023.3273664
Abstract: A technique based on artificial neural network (ANN) is proposed to extract the electromagnetic properties of reflection-asymmetric samples from reference-plane-invariant (RPI) scattering parameter measurements. It first determines reference plane transformation distances and then extracts the… read more here.
Keywords: artificial neural; reference plane; model; asymmetric samples ... See more keywords