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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.06.057
Abstract: Abstract Permanent faults are a common issue of contemporary CMOS circuits during fabrication and its lifetime. In order to detect these faults, designers adopt logic and delay-oriented testing approaches to validate the circuit's structure. However,…
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Keywords:
asynchronous circuits;
permanent faults;
learning based;
based reliability ... See more keywords
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Published in 2021 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2020.3038337
Abstract: The “event-driven” feature of asynchronous circuits enables the circuits to work when and where needed, making it a good alternative to design low-power circuits. However, asynchronous circuits are not widely adopted as a consequence of…
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Keywords:
asynchronous circuits;
design flow;
conventional eda;
eda tools ... See more keywords
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Published in 2021 at "International Journal of Electrical and Computer Engineering"
DOI: 10.11591/ijece.v11i3.pp2704-2710
Abstract: Designing VLSI digital circuits is challenging tasks because of testing the circuits concerning design time. The reliability and productivity of digital integrated circuits are primarily affected by the defects in the manufacturing process or systems.…
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Keywords:
fault;
fault tolerant;
asynchronous circuits;
fault injection ... See more keywords