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Published in 2019 at "Scripta Materialia"
DOI: 10.1016/j.scriptamat.2018.08.020
Abstract: Abstract The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)6Sn5 by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray…
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Keywords:
atomic resolution;
intermetallic compound;
locations doped;
atom locations ... See more keywords