Fast neutral atom microscopy: An optimisation framework for stagnation detectors
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DOI: 10.1016/j.measurement.2019.107263
Abstract: Abstract The nascent field of neutral helium microscopy, as well as many applications within atomic and molecular beam research, are currently restricted by low detector sensitivity. To compensate, system designers have relied on forming a… read more here.
Keywords: fast neutral; stagnation; microscopy; atom microscopy ... See more keywords