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Published in 2020 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2020.2991351
Abstract: We present a novel design of fine segmented low gain avalanche diodes (LGAD) based on trench-isolation technique. The proposed design reduces the width of the no-gain inter-pad region down to less than $10~\mu \text{m}$ ,…
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Keywords:
tex math;
gain avalanche;
gain;
inline formula ... See more keywords
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Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2017.2717463
Abstract: The resolution and accuracy of the number of photons detected by a silicon photomultiplier (SiPM) are limited by the excess noise, which consists mainly of after pulsing and optical crosstalk. Since these excess noises are…
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Keywords:
photon avalanche;
single photon;
probability;
avalanche diodes ... See more keywords
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Published in 2021 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2021.3071171
Abstract: We report on alpha and neutron irradiation of 7.8 $\boldsymbol {\mu }\text{m}$ single-photon avalanche diodes (SPADs) manufactured in 40-nm CMOS. Displacement damage leads to persistent dark count rate hot spots, due to carrier generation centers…
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Keywords:
damage;
single photon;
photon avalanche;
displacement damage ... See more keywords
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Published in 2022 at "Optics express"
DOI: 10.1364/oe.455513
Abstract: This paper presents the effect of shallow trench isolation (STI) on the dark count rate (DCR) and after-pulsing probability (APP) of deep-junction-based single-photon avalanche diodes (SPADs). Two different SPADs were fabricated in 110 nm CMOS…
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Keywords:
110 cmos;
avalanche diodes;
single photon;
photon avalanche ... See more keywords