Complete Avalanche Process and Failure Mechanism of Trench-Gate FS-IGBT Under Unclamped Inductive Switching by Using Infrared Visualization Method
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DOI: 10.1109/ted.2020.3011644
Abstract: The complete avalanche process of the trench-gate filed-stop insulated gate bipolar transistor (FS-IGBT) is first investigated based on an infrared visualization technology called step-control infrared thermography method. By this method, the details about the generation,… read more here.
Keywords: trench gate; avalanche; method; avalanche process ... See more keywords