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Published in 2022 at "Journal of Synchrotron Radiation"
DOI: 10.1107/s1600577522004738
Abstract: Non-destructive interface characterization of boron carbide shows a significant change at 550°C in the interface region formed between an adhesive chromium layer and native oxide layer on silicon substrate, whereas the principal layer of boron…
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Keywords:
study interface;
b4c mirror;
mirror elevated;
interface ... See more keywords