Modeling of Induced Gate Thermal Noise Including Back-Bias Effect in FDSOI MOSFET
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Microwave and Wireless Components Letters"
DOI: 10.1109/lmwc.2018.2834507
Abstract: We present a charge-based compact model for induced gate thermal noise for a fully depleted silicon-on-insulator transistor. The model uses front- and back-gate charges as well as the respective mobilities for the development of analytical… read more here.
Keywords: thermal noise; induced gate; gate thermal; model ... See more keywords
Comprehensive Analytical Comparison of Ring Oscillators in FDSOI Technology: Current Starving Versus Back-Bias Control
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Circuits and Systems I: Regular Papers"
DOI: 10.1109/tcsi.2022.3144527
Abstract: Back-bias control is a new degree of freedom brought by fully-depleted silicon-on-insulator (FDSOI) CMOS technologies, which can be used to control the oscillation frequency of voltage-controlled ring oscillators (VCROs). The resulting VCRO architecture is called… read more here.
Keywords: control; comparison; back bias; bias control ... See more keywords
Analytical Model for Interface Traps-Dependent Back Bias Capability and Variability in Ultrathin Body and Box FDSOI MOSFETs
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.3025979
Abstract: Independent back bias in the ultrathin body and Box (UTBB) fully depleted silicon-on-insulator (FDSOI) serves as the critical knob for exploiting the performance and power tradeoffs and process/aging compensation. The effectiveness of back bias is… read more here.
Keywords: variability; ultrathin body; back bias; interface traps ... See more keywords
Tree rings in Large Synoptic Survey Telescope production sensors: its dependence on radius, wavelength, and back bias voltage
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Astronomical Telescopes, Instruments, and Systems"
DOI: 10.1117/1.jatis.6.1.011005
Abstract: Abstract. Tree rings are one of the sensor effects that may affect precise measurements in the Large Synoptic Survey Telescope (LSST). The effect is caused by silicon wafer manufacturing process, resulting in formation of circular… read more here.
Keywords: large synoptic; back bias; tree rings; synoptic survey ... See more keywords