Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs
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DOI: 10.1109/tnano.2017.2706265
Abstract: FinFETs and ultrathin body and buried oxide fully depleted silicon on insulator (UTBB-FDSOI) are the main transistors currently used in advanced integrated circuits (ICs). The tunable electrical properties via back-biasing facilitate the threshold voltage adjustment… read more here.
Keywords: soi finfets; bulk finfets; utbb fdsoi; back biasing ... See more keywords