Articles with "back end" as a keyword



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System-Level Power Optimization of Digital Audio Back End for Hearing Aids

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Published in 2017 at "Circuits, Systems, and Signal Processing"

DOI: 10.1007/s00034-016-0419-z

Abstract: This work deals with power optimization of the audio processing back end for hearing aids—the interpolation filter, the sigma-delta ($$\Sigma \Delta )$$ΣΔ) modulator and the Class D power amplifier (PA) as a whole. Specifications are… read more here.

Keywords: back end; power optimization; system level; power ... See more keywords
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Directed motion of two-component droplets on wedge-shaped composite copper surfaces without back-end pinning

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Published in 2020 at "Microfluidics and Nanofluidics"

DOI: 10.1007/s10404-020-02376-w

Abstract: The motion of three-phase contact line of a droplet is always halted by the contact angle hysteresis on a common solid surface. In this work, the Ag/Cu surface and Cu(OH)2/Cu surface with water contact angle… read more here.

Keywords: shaped composite; back end; end; droplet ... See more keywords
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Microstructures of longitudinal/transverse welds and back-end defects and their influences on the corrosion resistance and mechanical properties of aluminum alloy extrusion profiles

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Published in 2019 at "Journal of Materials Processing Technology"

DOI: 10.1016/j.jmatprotec.2018.12.006

Abstract: Abstract Aluminum alloy profiles manufactured by semi-continuous porthole die extrusion have three kinds of intrinsic features: longitudinal welds, transverse welds and back-end defects, which affect the corrosion resistance and mechanical properties of the profiles. In… read more here.

Keywords: transverse welds; transverse; corrosion resistance; resistance mechanical ... See more keywords
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Intense pulsed light in back end processing of solar cells with passivating contacts based on amorphous or polycrystalline silicon layers

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Published in 2020 at "Solar Energy Materials and Solar Cells"

DOI: 10.1016/j.solmat.2020.110711

Abstract: Abstract Intense pulsed light (IPL) is capable of entirely replacing thermal annealing (curing and contact formation) within back end processing of silicon solar cells with passivating contacts. In order to demonstrate this, full-size silicon heterojunction… read more here.

Keywords: passivating contacts; back end; pulsed light; intense pulsed ... See more keywords
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A back-end, CMOS compatible ferroelectric Field Effect Transistor for synaptic weights

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Published in 2020 at "ACS applied materials & interfaces"

DOI: 10.1021/acsami.0c00877

Abstract: Neuromorphic computing architectures enable the dense co-location of memory and processing elements within a single circuit. This co-location removes the communication bottleneck of transferring data between separate memory and computing units as in standard von… read more here.

Keywords: back end; field effect; effect transistor;
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A Compute-in-Memory Hardware Accelerator Design With Back-End-of-Line (BEOL) Transistor Based Reconfigurable Interconnect

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Published in 2022 at "IEEE Journal on Emerging and Selected Topics in Circuits and Systems"

DOI: 10.1109/jetcas.2022.3177577

Abstract: Compute-in-memory (CIM) paradigm using ferroelectric field effect transistor (FeFET) as the weight element is projected to exhibit excellent energy efficiency for accelerating deep neural network (DNN) inference. However, two challenges exist. On the technology level,… read more here.

Keywords: design; compute memory; back end; end line ... See more keywords
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Back-End-of-Line Nano-Electro-Mechanical Switches for Reconfigurable Interconnects

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Published in 2020 at "IEEE Electron Device Letters"

DOI: 10.1109/led.2020.2974473

Abstract: Non-volatile (NV) nano-electro-mechanical (NEM) switches are successfully implemented using multiple metallic layers in a standard 65 nm CMOS back-end-of-line (BEOL) process with no additional lithography steps. Non-volatile operation of a NEM switch as a reconfigurable… read more here.

Keywords: end line; electro mechanical; nano electro; back end ... See more keywords
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Back-End-of-Line Compatible Transistors for Monolithic 3-D Integration

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Published in 2019 at "IEEE Micro"

DOI: 10.1109/mm.2019.2942978

Abstract: The manufacturers of high-performance logic have been ardent champions of Moore's Law, which has resulted in exponential increase in aerial transistor density to 100 million transistors per square millimeter of silicon real estate. However, it… read more here.

Keywords: end line; compatible transistors; line compatible; integration ... See more keywords
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PROBE: A Placement, Routing, Back-End-of-Line Measurement Utility

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Published in 2018 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2017.2750072

Abstract: In advanced technology nodes, correctly choosing among available back-end-of-line (BEOL) stack options is important to meet stringent design quality of results requirements. However, it is nontrivial to evaluate BEOL stack options since the routing outcomes… read more here.

Keywords: back end; end line; beol stack; design ... See more keywords
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A Web Back-End Database Leakage Incident Reconstruction Framework Over Unlabeled Logs

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Published in 2023 at "IEEE Transactions on Emerging Topics in Computing"

DOI: 10.1109/tetc.2022.3198080

Abstract: In this article, we propose a web back-end database leakage incident reconstruction framework (WeB-DLIR) over unlabeled logs, designed to improve the intelligence and automation of reconstructing web back-end database leakage incidents triggered by web-based attacks… read more here.

Keywords: web back; back end; database leakage; end database ... See more keywords
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Automatic Test System of the Back-End Card for the JUNO Experiment

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Published in 2021 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2021.3085369

Abstract: The Jiangmen Underground Neutrino Observatory (JUNO) is a medium-baseline neutrino experiment under construction in China, with the goal to determine the neutrino mass hierarchy. The JUNO electronics readout system consists of an underwater front-end electronics… read more here.

Keywords: system; test; back end; automatic test ... See more keywords