Spectroscopy of backscattered Cu ions detected by CR39 through grayness analysis of ion-etch tracks
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DOI: 10.1016/j.radmeas.2019.106204
Abstract: Abstract The paper reports on a semi-automatic method for the detection and analysis of ion-etch pits generated on Solid State Nuclear Track Detectors (SSNTD) of the CR39 type. The CR39 detectors have been exposed to… read more here.
Keywords: ion etch; ion; analysis ion; spectroscopy ... See more keywords