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Published in 2019 at "Materials Research Express"
DOI: 10.1088/2053-1591/ab02af
Abstract: Properties of CrB2 thin diffusion layers sputtered in Mo/Si multilayer structures and their effect on the x-ray/EUV reflectance are reported. A special attention is paid to determine a critical thickness t* for barrier layers where…
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Keywords:
crb2 diffusion;
multilayer structures;
diffusion;
diffusion barriers ... See more keywords