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Published in 2024 at "IEEE Transactions on Image Processing"
DOI: 10.1109/tip.2023.3348992
Abstract: Feature selection (FS) has recently attracted considerable attention in many fields. Highly-overlapping classes and skewed distributions of data within classes have been found in various classification tasks. Most existing FS methods are all instance-based, which…
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Keywords:
feature selection;
selection based;
intrusive outliers;
based intrusive ... See more keywords