Articles with "based sift" as a keyword



An Automatic Measurement Method for Absolute Depth of Objects in Two Monocular Images Based on SIFT Feature

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Published in 2017 at "Applied Sciences"

DOI: 10.20944/preprints201705.0028.v1

Abstract: Recovering depth information of objects from two-dimensional images is one of the very important and basic problems in the field of computer vision. In view of the shortcomings of existing methods of depth estimation, a… read more here.

Keywords: measurement method; based sift; feature; automatic measurement ... See more keywords