Bayesian multiparameter quantum metrology with limited data
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DOI: 10.1103/physreva.101.032114
Abstract: A longstanding problem in quantum metrology is how to extract as much information as possible in realistic scenarios with not only multiple unknown parameters, but also limited measurement data and some degree of prior information.… read more here.
Keywords: metrology limited; multiparameter quantum; quantum metrology; metrology ... See more keywords