Partial Bayesian Co-training for Virtual Metrology
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DOI: 10.1109/tii.2019.2903718
Abstract: Building accurate regression models using limited data is a challenging problem in manufacturing data analysis. In this paper, we study a particular semisupervised learning problem where labeled data are limited, while unlabeled data are plentiful.… read more here.
Keywords: training virtual; model; virtual metrology; metrology ... See more keywords