Beam broadening of keV electrons in matter calculated by numerical solution of the electron transport equation
Sign Up to like & getrecommendations! Published in 2021 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927621005845
Abstract: Electron microscopy at low primary electron energies E0 ≤ 30 keV has experienced increasing interest in the past years. At such low electron energies, the signal-to-noise ratio for material contrast is enhanced and knock-on-damage is… read more here.
Keywords: broadening kev; beam broadening; microscopy; electron ... See more keywords
Electron beam broadening in electron‐transparent samples at low electron energies
Sign Up to like & getrecommendations! Published in 2019 at "Journal of Microscopy"
DOI: 10.1111/jmi.12793
Abstract: Scanning transmission electron microscopy (STEM) at low primary electron energies has received increasing attention in recent years because knock‐on damage can be avoided and high contrast for weakly scattering materials is obtained. However, the broadening… read more here.
Keywords: microscopy; beam; beam broadening; electron ... See more keywords