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1
Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618006219
Abstract: In synergy with the continuous miniaturization of semiconductor devices with nanometer transistors as the basic building blocks, teams of physical failure analysis (PFA) and transmission electron microscopy (TEM) in wafer-foundries have to constantly explore novel…
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Keywords:
evaluation beam;
microscopy;
wafer;
damage zone ... See more keywords
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0
Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618010425
Abstract: Conjugated polymers are poised to play an important role in emerging organic electronic applications because they are soft and flexible, chemically versatile, and can be solution processed [1]. This unique combination of properties enables conjugated…
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Keywords:
elucidating mechanisms;
conjugated polymers;
mechanisms electron;
beam damage ... See more keywords
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2
Published in 2022 at "Journal of the American Society for Mass Spectrometry"
DOI: 10.1021/jasms.2c00226
Abstract: Characterizing proton beam damage in biological materials is of interest to enable the integration of proton microprobe elemental mapping techniques with other imaging modalities. It is also of relevance to obtain a deeper understanding of…
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Keywords:
beam;
proton beam;
beam damage;
damage lipids ... See more keywords