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Published in 2022 at "Microscopy Research and Technique"
DOI: 10.1002/jemt.24212
Abstract: Laser scanning optical beam induced current (OBIC) microscopy has become a powerful and nondestructive alternative to other complicated methods like electron beam induced current (EBIC) microscopy, for high resolution defect analysis of electronic devices. OBIC…
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Keywords:
obic microscopy;
beam;
beam induced;
microscopy ... See more keywords
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Published in 2025 at "Medical Physics"
DOI: 10.1002/mp.17622
Abstract: Previous studies have shown that in‐beam magnetic resonance imaging (MRI) can be used to visualize a proton beam during the irradiation of liquid‐filled phantoms. The beam energy‐ and current‐dependent local image contrast observed in water…
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Keywords:
proton beam;
beam induced;
oxygen depletion;
beam ... See more keywords
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Published in 2019 at "Journal of Materials Science: Materials in Electronics"
DOI: 10.1007/s10854-019-02577-2
Abstract: This paper investigates the properties of Copper–Selenium heterojunction nanowires before and after implantation. Heterojunction between Cu and Se was formed using the template method, assisted by chronoamperometry technique. Implantation in heterojunction nanowires was performed with…
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Keywords:
ion beam;
beam induced;
implantation;
heterojunction ... See more keywords
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Published in 2017 at "Chemical Physics Letters"
DOI: 10.1016/j.cplett.2016.11.041
Abstract: Abstract Ion-beam sputtering technique has been utilized for controlled synthesis of metal alloy nanoparticles of compositions that can be tuned. Analysis of various experimental results reveals the formation of Ag-Cu alloy nanoparticles on a silica…
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Keywords:
ion beam;
beam induced;
alloy nanoparticles;
ion ... See more keywords
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Published in 2017 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2017.10.012
Abstract: Abstract Focused electron beam induced deposition (FEBID) is a direct-write method for the fabrication of nanostructures whose lateral resolution rivals that of advanced electron beam lithography but is in addition capable of creating complex three-dimensional…
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Keywords:
induced deposition;
beam induced;
materials science;
electron beam ... See more keywords
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Published in 2017 at "Microscopy and Microanalysis"
DOI: 10.1017/s143192761700962x
Abstract: Over the last decade it became evident that atomic resolution electron microscopy allows reliably analyzing matter down to single atoms as long as electron beam-induced object alterations remain negligible. In general, however, nano-objects are unavoidably…
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Keywords:
resolution;
microscopy;
beam induced;
electron beam ... See more keywords
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Published in 2017 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927617011989
Abstract: Spontaneous formation of complex geometric patterns is an interesting phenomenon that provides fundamental insights into underlying roles of symmetry breaking, anisotropy and non-linear interactions [1]. Here, dynamic, highly ordered topographic patterns on the surface of…
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Keywords:
induced etching;
beam induced;
formation;
diamond ... See more keywords
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Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618002155
Abstract: The next generation of advanced computing devices will require complex nanoscale frameworks that extend into 3D. Focused ion beam induced deposition (FIBID), uses an organometallic precursor gas in a field ion microscope to fabricate nanoscale…
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Keywords:
induced deposition;
ion beam;
beam induced;
deposition ... See more keywords
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Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618012965
Abstract: 1. Physical Chemistry II, Friedrich-Alexander-Univers ität Erlangen-Nürnberg, Erlangen, Germany. 2. present address: Carl Zeiss Semiconductor Manufact uring Technology, Roßdorf, Germany. 3. Elettra-Sincrotrone Trieste, Area Science Park, Tr ieste, Italy. 4. Swiss Light Source, Paul Scherrer…
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Keywords:
deposition recent;
induced deposition;
beam induced;
focused soft ... See more keywords
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Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619003994
Abstract: Electron energy-loss spectroscopy (EELS) performed in an aberration-corrected STEM has a higher signal-to-noise ratio compared to EELS in a conventional STEM, allowing for more information to be extracted from the ionization edges. Additionally, the higher…
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Keywords:
spectroscopy;
beam induced;
electron energy;
deposition ... See more keywords
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Published in 2019 at "Journal of Materials Chemistry C"
DOI: 10.1039/c9tc04561a
Abstract: Time-resolved morphological evolution of Fe2TiO5 nanoparticles produced with addition of polyvinyl-pyrrolidone under the electron beam irradiation.
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Keywords:
morphology transformations;
beam induced;
fe2tio5 nanoparticles;
induced morphology ... See more keywords