Lab and test beam results of irradiated silicon sensors with modified ATLAS pixel implantations
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DOI: 10.1088/1748-0221/13/11/c11004
Abstract: In Dortmund, planar silicon pixel sensors were designed with modified n+-implantations and produced in n+-in-n sensor technology. Baseline for these new designs was the layout of the IBL planar silicon pixel sensor with a 250… read more here.
Keywords: lab test; test beam; test; pixel ... See more keywords