Sign Up to like & get
recommendations!
1
Published in 2018 at "Journal of Semiconductors"
DOI: 10.1088/1674-4926/39/9/094007
Abstract: Trap-induced current collapse has become one of the critical issues hindering the improvement of GaN-based microwave power devices. It is difficult to study the behavior of each trapping effect separately with the experimental measurement. Transient…
read more here.
Keywords:
current collapse;
trapping behaviors;
behaviors performance;
gan based ... See more keywords