Application of benchtop micro-XRF to geological materials
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DOI: 10.1180/minmag.2016.080.150
Abstract: Abstract Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20-30 μm on the sample, allowing major- and… read more here.
Keywords: geological materials; analysis; micro xrf; benchtop micro ... See more keywords