Berger code based concurrent online self-testing of embedded processors
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DOI: 10.1088/1674-4926/39/11/115001
Abstract: We propose an approach to detect the temporary faults induced by an environmental phenomenon called single event upset (SEU). Berger code based self-checking checkers provides an online detection of faults in digital circuits as well… read more here.
Keywords: code based; self; self testing; berger code ... See more keywords