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Published in 2017 at "Measurement"
DOI: 10.1016/j.measurement.2017.03.035
Abstract: Abstract In this work, a new measurement method based on atomic force microscope (AFM) and confocal laser scanning microscope (CLSM) is proposed to determine the radius and angle parameters of diamond Berkovich indenter. In order…
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Keywords:
indenter;
radius;
determination;
radius angle ... See more keywords
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Published in 2019 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2019.04.037
Abstract: Abstract Single crystal silicon is the basic material for the fabrication of micro-devices and micro-structures. It exhibits plastic behavior in micro/nano-machining. The key to obtain high-quality machined surfaces in ultra-precision machining of brittle materials is…
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Keywords:
scratching machining;
single crystal;
crystal silicon;
material removal ... See more keywords