Influence of Sputtering Power on the Structure and Electrical Properties of Bi2Fe4O9 Thin Films
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DOI: 10.1007/s40195-017-0537-z
Abstract: Bismuth ferrite (Bi2Fe4O9) thin films were grown on p-type Si (100) substrate by radio-frequency magnetron sputtering at 873 K. X-ray diffraction, field emission scanning electron microscopy and Raman spectroscopy studies revealed that the grown films have… read more here.
Keywords: thin films; bi2fe4o9 thin; microscopy; power ... See more keywords