Large Bidirectional Refractive Index Change in Silicon‐rich Nitride via Visible Light Trimming
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DOI: 10.1002/adom.202403420
Abstract: Phase‐sensitive integrated photonic devices are highly susceptible to minor manufacturing deviations, resulting in significant performance inconsistencies. This variability has limited the scalability and widespread adoption of these devices. Here, a major advancement is achieved through… read more here.
Keywords: rich nitride; visible light; silicon rich; bidirectional refractive ... See more keywords