XPS Study in BiFeO3 Surface Modified by Argon Etching
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DOI: 10.3390/ma15124285
Abstract: This paper reports an XPS surface study of pure phase BiFeO3 thin film produced and later etched by pure argon ions. Analysis of high-resolution spectra from Fe 2p, Bi 4f and 5d, O 1s, and… read more here.
Keywords: study bifeo3; bifeo3 surface; argon etching; xps study ... See more keywords