Bayesian Assessment of a Binary Measurement System with Baseline Data
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DOI: 10.1080/01966324.2017.1338976
Abstract: SYNOPTIC ABSTRACT Binary measurement systems that classify parts as either pass or fail are widely used. In industrial settings, many previously passed and failed parts are often available. We develop a Bayesian model to incorporate… read more here.
Keywords: system; binary measurement; baseline data; baseline ... See more keywords