Built-In Self-Test (BIST) Methods for MEMS: A Review
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DOI: 10.3390/mi12010040
Abstract: A novel taxonomy of built-in self-test (BIST) methods is presented for the testing of micro-electro-mechanical systems (MEMS). With MEMS testing representing 50% of the total costs of the end product, BIST solutions that are cost-effective,… read more here.
Keywords: bist methods; built self; test bist; self test ... See more keywords