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Published in 2019 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2019.2897278
Abstract: This paper investigates the effect of total ionizing dose (TID) on body current in 130-nm partially depleted (PD) silicon-on-insulator input–output nMOSFETs. As the TID increases, the body current lowers and the peak point of body…
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Keywords:
effect total;
body;
ionizing dose;
body current ... See more keywords