Articles with "bonded samples" as a keyword



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Effects of argon plasma pretreatment of Si wafers on Si-Si bonding based on Mo/Au interlayers

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Published in 2023 at "Surface Topography: Metrology and Properties"

DOI: 10.1088/2051-672x/acd569

Abstract: To improve the bonding quality of Si-Si wafers bonded based on Mo/Au intermediate layers at room temperature, the surfaces of Si wafers were pretreated with argon plasma, and the effect of argon plasma pretreatment on… read more here.

Keywords: argon plasma; surface; plasma pretreatment; plasma ... See more keywords