Bonding Structures of ZrHx Thin Films by X-ray Spectroscopy
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DOI: 10.1021/acs.jpcc.7b03223
Abstract: The variation in local atomic structure and chemical bonding of ZrHx (x = 0.15, 0.30, and 1.16) magnetron sputtered thin films are investigated by Zr K-edge (1s) X-ray absorption near-edge structure and extended X-ray absorption… read more here.
Keywords: thin films; hydrogen; bonding structures; spectroscopy ... See more keywords