Boron Vacancies Causing Breakdown in 2D Layered Hexagonal Boron Nitride Dielectrics
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DOI: 10.1109/led.2019.2923420
Abstract: Dielectric breakdown in 2D insulating films for future logic device technology is not well understood yet, in contrast to the extensive insight we have in the breakdown of bulk dielectric films, such as HfO2 and… read more here.
Keywords: hexagonal boron; vacancies causing; boron nitride; boron vacancies ... See more keywords